With the development of industry, a variety of power electronic products have emerged. In order to make these products stable and reliable in some fields, their performance must be tested in an all-round way. In order to meet some tests, complex and arbitrary changes of current and voltage are needed, and the performance, accuracy and reliability of electronic load are highly required.
APM DC Electronic Load powerful program sequence (list) function can solve any change of voltage and current; it can simulate complex and diverse current point load test as shown in the figure below. The load setting process is simple and fast, which not only allows customers to complete the test quickly, but also reduces cost.
This function can edit 10 groups of programs, including 300 groups of sequences, with a single step time range of 99H: 59M: 59S. It can run for a long time under the program function. According to the test requirements, each step of a program can set the required operation mode separately: CC, CV, CR, CP, short circuit and load off. At the same time, the edited program files can be saved in the Programmable DC electronic load and quickly called out when using; different programs can be linked together to form a variety of complex sequence combinations, such as: Programs 1, 3, 2, 5 are connected together and run in order.
Each step in the program can set the trigger mode as required:
Skip: skip the sequence, the load will not change the input state.
Auto: the load will run next sequence automatically when the Dwell time exceeds.
Manual: when press ENTER; the load will automatically proceed to the next sequence.
External: use external analog signal to control load input switch.
APM high power DC electronic load has perfect functions. At the same time, the maximum input power of a single machine reaches 26.4KW, the maximum input voltage of a single machine is 1200V, and the maximum input current of a single machine is 2880A. It can be used in parallel with multiple sets. The single-step time with super long program function, various operation modes, and multiple triggering modes are the best choice for test demand.